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Fast Facts

Defects In Semiconductors

Aug 03, 2008 - Aug 08, 2008
Colby-Sawyer College, New London, New Hampshire United States
 

Highlights

Continuing its tradition of excellence, this Gordon Conference will focus on research at the forefront of the field of defects in homogeneous and structured semiconductors. The conference will have a strong emphasis on the control of defects during growth and processing, with an increases emphasis on nanostructures as compared to previous conferences. Electronic, magnetic, and optical properties of bulk, thin film, and nanoscale semiconductors will be discussed in detail. In contrast to many conferences, which tend to focus on specific semiconductors, this conference deals with defects in a broad range of bulk and nanoscale electronic materials. This approach has proved to be extremely fruitful for advancing fundamental understanding in emerging materials such as wide-band-gap semiconductors, doped nanoparticles, and organic semiconductors. Presentations of state-of-the-art theoretical methods will contribute to a fundamental understanding of atomic-scale phenomena. The program consists of about twenty invited talks, with plenty of discussion time, and a number of contributed poster sessions. Because of the large amount of discussion time, the conference provides an ideal forum for dealing with topics that are new and/or controversial.

The title, authors, and a brief abstract of your poster should be sent to the vice-chair Shengbai Zhang by July 13, 2008.

Contact Details

Contact person: Matt Mccluskey
Email address:
Event website: http://www.grc.org/programs.aspx?year=2008&program=defects

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