Goingtomeet.com: 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2008)

23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2008)

Oct 01, 2008 - Oct 03, 2008
Hyatt Regency Cambridge Cambridge, Massachusetts United States

Highlights: DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.

Event Profiles: Sponsors: IEEE Computer Society,IEEE Test Technology Technical Council, IEEE Fault-Tolerant Computing Technical Commitee

Contact Details: Contact person: Cristiana Bolchini; Email address:; Event website: http://www.dfts.org/; Phone: +39 02 2399-3619; Fax: +39 02 2399-3411

Tags: Tag: fault_tolerance VLSI_system emerging_technologies yield_analysis testing_techniques error_detection

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