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Fast Facts

International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2009

May 11, 2009 - May 15, 2009
College of Nanoscale Science and Engineering, University at Albany Albany, New York United States
 

Highlights

The 2009 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled Characterization and Metrology for ULSI Technology) will be held the week of May 11-15, 2009, at the College of Nanoscale Science and Engineering, University at Albany, Albany, New York. This conference, the seventh in the series, focuses on the frontiers and innovation in characterization and metrology of nanoelectronics.


Event Profiles

Sponsors: NIST, semi, ISMI, APS Physics, semiconductor International

Contact Details

Contact person: David G. Seiler
Email address:
Event website: http://www.eeel.nist.gov/812/conference/
Phone: (301) 975-2054
Fax: (301) 975-6021

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