GoingToMeet

The chosen Congress theme, Fundamental and Applied Metrology, is as broad as Metrology itself and intends to encompass all activities in the science of measurement domain, either more theoretical, mathematical and physical oriented or more practical, engineering oriented, but equally important for the development of Metrology. Thus, we trust and expect this IMEKO major event to attract contributions from worldwide experts, researchers and professionals, so as to enable the Program Committee to put up a comprehensive and high-level technical program that will make this an event not to be missed. Participants will have the opportunity to meet colleagues and experts and to discuss state-of-the art developments of measurements science, technology and standards.
IMEKO World Congresses have been one of the most important events in the Metrology domain and we are sure that you and all the people involved in the organization of the IMEKO XIX World Congress will continue to keep and even increase the standard of such events.